ЕВРОПИЙ КИРИШМА АТОМЛАРИ КИРИТИЛГАН КРЕМНИЙГА МАГНИТ МАЙДОН ТАЪСИРИ

Authors

  • Н.Ф. Зикриллаев

    Tashkent State Technical University named after Islam Karimov image/svg+xml

  • Л. Трабзон

    Истамбул техника университети

  • Қ.А. Исмаилов

    Karakalpak State University image/svg+xml

  • Ғ.Ҳ. Мавлонов

    Tashkent State Technical University named after Islam Karimov image/svg+xml

  • Й.А. Абдуғаниев

    Tashkent State Technical University named after Islam Karimov image/svg+xml

  • О.С. Неъматов

    Samarkand State University named after Sharof Rashidov image/svg+xml

  • Т.Б. Исмаилов

    Karakalpak State University image/svg+xml

Keywords: AFM, XRD, Bragg-Brentano, X-rays, lattice constant, Miller index, Bragg angle

Abstract

After diffusion of europium impurity atoms, its electric parameters were studied by the The Van der Pauw (VDP) method. The obtained scientific research results were examined in the surface morphology using an atomic force microscope (AFM). The lattice constant of the materials was calculated with the help of Bragg Brentano`s law using X-ray diffraction on the XRD pattern of the Si

sample.

References

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12. Dmitry V. Averyanova, Andrey M. Tokmacheva, Oleg E. Parfenova, Igor A. Karateeva, Ivan S. Sokolova, Alexander N. Taldenkova, Mikhail S. Platunovb, Fabrice Wilhelmb, Andrei Rogalevb, Vyacheslav G. Storchaka, //Probing proximity effects in the ferromagnetic semiconductor EuO/ Applied Surface Science/488(2019)107-114.